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12 results

Conference Proceedings

1. Applying of helicity in analysis of a severe sandstorm [5890-54]

Tao, J. ; Wang, J. ; Feng, J. ; Chang, Y. ; Liu, X.

Pub. info.:	Atmospheric and environmental remote sensing data processing and utilization : numerical atmospheric prediction and environment monitoring : 1-4 August 2005, San Diego, California, USA. pp.58901C-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5890

Conference Proceedings

2. Electromigration Under AC Current Stress

Hu, C ; Cheung, N. ; Tao, J.

Pub. info.:	Proceedings of the Symposium on Reliability of Metals in Electronics. pp.188-202, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-3

Conference Proceedings

3. THE ORIGIN OF ANOMALOUS STRAIN IN THIN SPUTTERED Mo FILMS ON Si(100)

Tao, J. ; Adams, D. ; Yasilove, S. M. ; Bilello, J. C.

Pub. info.:	Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.57-62, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	239

Conference Proceedings

4. PLANARIZED COPPER INTERCONNECTS BY SELECTIVE ELECTROLESS PLATING

Kiang, M.H. ; Tao, J. ; Namgoong, W. ; Hu, C. ; Lieberman, M. ; Cheung, N. W. ; Kang, H.-K. ; Wong, S. S.

Pub. info.:	Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.. pp.187-198, 1992. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	265

Conference Proceedings

5. Nanocrystalline Rare Earth-Doped Gallium Nitride Phosphor Powders

Hirata, G.A. ; Tao, J. ; Chen, P. ; Mishra, K.C. ; McKittrick, J.

Pub. info.:	Rare-earth doping for optoelectronic applications : symposium held March 29-31, 2005, San Francisco, California, U.S.A.. pp.201-206, 2005. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	866

Conference Proceedings

6. PHASE IDENTIFICATION IN RAPIDLY SOLIDIFIED Al-In ALLOYS USING HIGH RESOLUTION SYNCHROTRON RADIATION DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY

Tao, J. ; Aken, D. C. Van ; Bilello, J. C.

Pub. info.:	Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A.. pp.299-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	307

Technical Paper

7. Dry Wire Electrical Discharge Machining of Thin Workpiece.

Kao, C.C. ; Tao, J. ; Lee, S. ; Shih, A.J.

Pub. info.:	S.M.E. technical paper. 2006. Dearborn, Mich.. Society of Manufacturing Engineers
Title of ser.:	SME Technical Paper : TP
Ser. no.:	2006

Technical Paper

8. Low Temperature Impact Testing of Plastic Materials.

Tao, J. ; Vesey, D.A. ; Gutowski, R.T. ; Lang, K.-J.

Pub. info.:	2005 SAE world congress : technical paper. 2005. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2005

Conference Proceedings

9. MEMS-based redundancy ring for low-noise millimeter-wave front-end

Pons, P. ; Dubuc, D. ; Flourens, F. ; Saddaoui, M. ; Melle, S. ; Tackacs, A. ; Tao, J. ; Aubert, H. ; Boukabache, A. ; Paillot, T. ; Blondy, P. ; Vendier, O. ; Grenier, K. M. ; Plana, R.

Pub. info.:	MEMS, MOEMS, and Micromachining. pp.181-192, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5455

10.

Conference Proceedings

10. Nanoimprint and soft lithography for planar photonic meta-materials (Invited Paper) [5955-12]

Chen, Y. ; Tao, J. ; Zhao, X. ; Cui, Z. ; Schwanecke, A.S. ; Zheludev, N.I.

Pub. info.:	Metamaterials. pp.59550C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5955

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