1.

Conference Proceedings
Conference Proceedings
1. X-RAY REFLECTOMETRY FROM SEMICONDUCTOR SURFACES AND INTERFACES
Tanner, Brian K. ; Miles, Simon J. ; Keith Bowen, D. ; Hart, Linda ; Loxley, Neil
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.345-350,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
2.

Conference Proceedings
Conference Proceedings
2. DOUBLE AXIS X-RAY DIFFRACTOMETRY ANALYSIS OF THE HOMOEPITAXIAL INTERFACE BETWEEN SUBSTRATE AND BUFFER LAYER
Stephan Green, G. ; Tanner, Brian K. ; Kightley, Philip
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.315-320,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
3.

Conference Proceedings
Conference Proceedings
3. X-RAY TOPOGRAPHY STUDIES OF OXYGEN PRECIPITATES IN MCZ SILICON
Holland, Anthony J. ; Stephan Green, G. ; Tanner, Brian K. ; Zhenhong, Mai
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.475-480,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
4.

Conference Proceedings
Conference Proceedings
4. X-RAY DOUBLE CRYSTAL TOPOGRAPHY OF PROCESSED SILICON WAFERS
Loxley, Neil ; Tanner, Brian K.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.215-220,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82
5.

Conference Proceedings
Conference Proceedings
5. THE CONTRAST OF DISLOCATIONS IN X-RAY TOPOGRAPHS HOMOGENEOUSLY BENT SILICON CRYSTALS
Loxley, Neil ; Tanner, Brian K.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.209-214,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82
6.

Conference Proceedings
Conference Proceedings
6. Elastic Constants of Nanometer Thick Diamond-Like Carbon Films
Beghi, Marco G. ; Bottani, Carlo E. ; LiBassi, Andrea ; Pastorelli, Rosanna ; Tanner, Brian K. ; Ferrari, Andrea C. ; Robertson, John
Pub. info.: Nanotubes, fullerenes, nanostructures and disordered carbon : symposium held April 17-20, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 675
7.

Conference Proceedings
Conference Proceedings
7. APPLICATION OF A DESK-SIDE DOUBLE-AXIS X-RAY DIFFRACTOMETER FOR VERY LARGE AREA EPILAYER CHARACTERIZATION
Loxley, Neil ; Keith Bowen, D. ; Tanner, Brian K.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.119-124,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
8.

Conference Proceedings
Conference Proceedings
8. THE PERFORMANCE OF CHANNEL CUT COLLIMATORS FOR PRECISION X-RAY DIFFRACTION STUDIES OF EPITAXIAL LAYERS
Loxley, Neil ; Keith Bowen, D. ; Tanner, Brian K.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.107-112,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
9.

Conference Proceedings
Conference Proceedings
9. PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF DOUBLE-AXIS X-RAY ROCKING CURVES OF THIN EPITAXIAL FILMS
Keith Bowen, D. ; Loxley, Neil ; Tanner, Brian K. ; Cooke, Lynne ; Capano, Michael A.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.113-118,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208