1.

Conference Proceedings

Conference Proceedings
Wang,N. ; Shan,Y. ; Ma,W. ; Yang,D. ; Gong,K. ; Ma,J. ; Tang,X. ; Jang,X. ; Wang,X.
Pub. info.: ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic.  pp.108-111,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4424
2.

Conference Proceedings

Conference Proceedings
Shan,Y. ; Wang,N. ; Ma,W. ; Yang,D. ; Wang,X. ; Ma,J. ; Jang,X. ; Gong,K. ; Gao,H. ; Tang,X. ; Tao,Y.
Pub. info.: ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic.  pp.104-107,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4424
3.

Conference Proceedings

Conference Proceedings
Li,J. ; Gan,F. ; Gu,D. ; Tang,X.
Pub. info.: Optical storage technology : 16-18 September, 1998, Beijing, China.  pp.179-181,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3562
4.

Conference Proceedings

Conference Proceedings
Yin,J. ; Gu,D. ; Tang,F. ; Tang,X. ; Gan,F.
Pub. info.: Optical storage technology : 16-18 September, 1998, Beijing, China.  pp.174-178,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3562
5.

Conference Proceedings

Conference Proceedings
L'Hostis,P. ; Byers,F. ; Podio,F.L. ; Tang,X.
Pub. info.: Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado.  pp.106-112,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3806
6.

Conference Proceedings

Conference Proceedings
Jiang,C. ; Liu,H. ; Zeng,Q. ; Tang,X. ; Zhang,J. ; Gan,F.
Pub. info.: Rare-earth-doped materials and devices IV : 26-27 January 2000, San Jose, California.  pp.306-311,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3942
7.

Conference Proceedings

Conference Proceedings
Li,Z. ; Wang,Z. ; Tang,X. ; Qiang,X.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.131-134,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
8.

Conference Proceedings

Conference Proceedings
Godfried,H.P. ; Coe,S.E. ; Hall,C.E. ; Pickles,C.S.J. ; Sussmann,R.S. ; Tang,X. ; Voorden,W.K.L.van der
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.553-563,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
9.

Conference Proceedings

Conference Proceedings
Tang,X. ; Manos,K.M. ; Wang,Q. ; Nichols,C.A.
Pub. info.: Challenges in process integration and device technology : 18-19 September 2000, Santa Clara, USA.  pp.324-334,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4181
10.

Conference Proceedings

Conference Proceedings
Jiang,C. ; Zeng,Q. ; Liu,H. ; Tang,X. ; Yang,X.
Pub. info.: Rare-earth-doped materials and devices IV : 26-27 January 2000, San Jose, California.  pp.318-329,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3942