1.

Conference Proceedings

Conference Proceedings
Ishimori,Y. ; Kawano,K. ; Tamura,H. ; Aoyama,N. ; Mouri,M. ; Kase,T. ; Tamiya,E. ; Ishizuka,M.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology : 18-21 September 2001, Toulouse, France.  pp.312-319,  2001.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4545
2.

Conference Proceedings

Conference Proceedings
Tamiya,E. ; Iwabuchi,S. ; Hashigasako,A. ; Murakami,Y. ; Sakaguchi,T. ; Morita,Y. ; Yokoyama,K.
Pub. info.: Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California.  pp.42-51,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3607
3.

Conference Proceedings

Conference Proceedings
Iwabuchi,S. ; Hashigasako,A. ; Morita,Y. ; Sakaguchi,T. ; Murakami,Y. ; Yokoyama,K. ; Tamiya,E.
Pub. info.: Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California.  pp.102-107,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3607
4.

Conference Proceedings

Conference Proceedings
Muramatsu,H. ; Kim,J.-M. ; Otani,T. ; Homma,K. ; Yoshida,M. ; Tate,S. ; Saito,M. ; Tamiya,E.
Pub. info.: Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California.  pp.99-104,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3922
5.

Conference Proceedings

Conference Proceedings
Degenaar,P. ; Murakami,Y. ; Yokoyama,K. ; Tamiya,E. ; Pioufle,B.Le ; Fujita,Y.
Pub. info.: Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California.  pp.189-198,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3922
6.

Conference Proceedings

Conference Proceedings
Ishimori,Y. ; Tamura,H. ; Kawano,K. ; Aoyama,N. ; Tamiya,E.
Pub. info.: Water, ground, and air pollution monitoring and remediation : 6-7 November 2000, Boston, USA.  pp.43-50,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4199
7.

Conference Proceedings

Conference Proceedings
Tamiya,E.
Pub. info.: Advanced technologies for environmental monitoring and remediation : 6-8 August 1996, Denver, Colorado.  pp.36-41,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2835
8.

Conference Proceedings

Conference Proceedings
Tamiya,E. ; Iwabuchi,S. ; Murakami,Y. ; Sakaguchi,T. ; Yokoyama,K. ; Chiba,N. ; Muramatsu,H.
Pub. info.: Chemical, biochemical, and environmental fiber sensors VIII : 6-7 August 1996, Denver, Colorado.  pp.12-15,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2836
9.

Conference Proceedings

Conference Proceedings
Murakami,Y. ; Yokoyama,K. ; Tamiya,E.
Pub. info.: Micro- and Nanofabricated Structures and Devices for Biomedical Environmental Applications.  pp.11-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3258