1.

Conference Proceedings
Conference Proceedings
1. Gain switching of GaInN MQW laser diodes
Marinelli,C. ; Khrushchev,I.Y. ; Rorison,J.M. ; Penty,R.V. ; White,I.H. ; Takeuchi,T. ; Amano,H. ; Akasaki,I. ; Kaneko,Y. ; Watanabe,S.W. ; Yamada,N. ; Hasnain,G. ; Schneider,R.P. ; Wang,S.-Y.
Pub. info.: Light-emitting diodes : research, manufacturing, and applications IV : 26-27 January 2000, San Jose, California.  pp.52-59,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3938
2.

Conference Proceedings
Conference Proceedings
2. Improved images by a 3.5-MHz array probe using 0.91Pb(Zn1/3Nb2/3)O3-0.09PbTiO3 single crystal
Saitoh,S. ; Takeuchi,T. ; Kobayashi,T. ; Harada,K. ; Shimanuki,S. ; Yamashita,Y.
Pub. info.: Medical imaging 1999, Ultrasonic transducer engineering : 24-25 February 1999, San Diego, California.  pp.147-154,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3664
3.

Conference Proceedings
Conference Proceedings
3. Heteroepitaxy of Group III Nitrides for Device Applications
Amano,H. ; Takeuchi,T. ; Sakai,H. ; Yamaguchi,S. ; Wetzel,C. ; Akasaki,I.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1115-1120,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. Ultrahigh-capacity multidata layer ROM
Nishida,T. ; Anzai,Y. ; Shimano,T. ; Nakano,K. ; Takeda,N. ; Azuma,J. ; Takeuchi,T. ; Tsunoda,Y.
Pub. info.: Optical Recording, Storage, and Retrieval Systems.  pp.2-9,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2890