Smart structures and devices : 13-15 December 2000, Melbourne, Australia. 4235 pp.79-88, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado. pp.303-311, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.155-160, 1992. Zurich, Switzerland. Trans Tech Publications
Smart structures and materials 2001 : Active materials : behavior and mechanics : 5-8 March, 2001, Newport Beach, USA. 4333 pp.314-321, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany. 4398 pp.199-206, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Superconducting and related oxides, physics and nanoengineering IV : 24-28 April 2000, Orlando, USA. pp.255-264, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.531-536, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications