1.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Kato,K. ; Qiu,J. ; Tani,J.
Pub. info.: Smart structures and devices : 13-15 December 2000, Melbourne, Australia.  4235  pp.79-88,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4235
2.

Conference Proceedings

Conference Proceedings
Kong,W.M. ; Takahashi,H. ; Nakajima,M.
Pub. info.: Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado.  pp.303-311,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2847
3.

Conference Proceedings

Conference Proceedings
Lee,P. ; Takahashi,H. ; Nakajima,M.
Pub. info.: Input/Output and Imaging Technologies.  pp.210-216,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3422
4.

Conference Proceedings

Conference Proceedings
Takahashi,H. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.155-160,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
5.

Conference Proceedings

Conference Proceedings
Kobayashi,Y. ; Um,T.Y. ; Qiu,J. ; Tani,J. ; Takahashi,H.
Pub. info.: Smart structures and materials 2001 : Active materials : behavior and mechanics : 5-8 March, 2001, Newport Beach, USA.  4333  pp.314-321,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4333
6.

Conference Proceedings

Conference Proceedings
Yoshizawa,T. ; Takahashi,H. ; Yamamoto,M. ; Otani,Y. ; Fujita,H.
Pub. info.: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  4398  pp.199-206,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4398
7.

Conference Proceedings

Conference Proceedings
Chiba,K. ; Takahashi,H. ; Nozaki,W. ; Akima,S. ; Nagashige,S. ; Yamada,Y.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.430-440,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
8.

Conference Proceedings

Conference Proceedings
Matsuoka,G. ; Saton,H. ; Fujii,A. ; Mizuno,K. ; Nakahara,T. ; Asai,S. ; Kadowaki,Y. ; Shimada,H. ; Touda,H. ; Iizumi,K. ; Takahashi,H. ; Oonuki,K. ; Kawahara,T. ; Kawasaki,K. ; Nagata,K.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.45-55,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
9.

Conference Proceedings

Conference Proceedings
Iguchi,I. ; Wang,W. ; Lee,K. ; Kume,E. ; Takahashi,H.
Pub. info.: Superconducting and related oxides, physics and nanoengineering IV : 24-28 April 2000, Orlando, USA.  pp.255-264,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4058
10.

Conference Proceedings

Conference Proceedings
Shimomura,S. ; Takahashi,H. ; Takaoka,S. ; Murase,K.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.531-536,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41