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103 results

Conference Proceedings

1. Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature

S. Tanimoto ; T. Suzuki ; A. Hanamura ; M. Hoshi ; T. Shinohara ; K. Arai

Pub. info.:	Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006. pp.779-782, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	556-557

Conference Proceedings

2. Encapsulating Annealing of N+ Implanted 4H-SiC by Diamond-Like-Carbon Film

S. Miyagawa ; T. Suzuki ; T. Kudo ; M. Satoh

Pub. info.:	Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006. pp.583-586, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	556-557

Conference Proceedings

3. Effects of Surface Morphological Defects and Crystallographic Defects on Reliability of Thermal Oxides on C-Face

T. Suzuki ; H. Yamaguchi ; T. Hatakeyama ; H. Matsuhata ; J. Senzaki

Pub. info.:	Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA. pp.789-792, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	717-720

Conference Proceedings

4. Evaluation of Cutting Process on the Tensile and Fatigue Strength of CFRP Composites

Y. Harada ; K. Kawai ; T. Suzuki ; T. Teramoto

Pub. info.:	THERMEC 2011 : International Conference on Processing & Manufacturing of Advanced Materials : processing, fabrication, properties, applications, August 1-5, 2011, Quebec City, Canada. pp.649-654, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	706-709

Conference Proceedings

5. 1.4kV Double-Implanted MOSFETs Fabricated on 4H-SiC(000-1)

H. Kono ; T. Suzuki ; K. Takao ; M. Furukawa ; M. Mizukami

Pub. info.:	Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd. pp.607-612, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	679-680

Conference Proceedings

6. Effect of Gate Wet Reoxidation on Reliability and Channel Mobility of Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated on 4H-SiC(000-1)

T. Suzuki ; J. Senzaki ; T. Hatakeyama ; K. Fukuda ; T. Shinohe

Pub. info.:	Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007. pp.791-794, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	600-603

Conference Proceedings

7. Impact of the Wafer Quality on the Reliability of MOS Structure on the C-Face of 4H-SiC

T. Hatakeyama ; T. Suzuki ; J. Senzaki ; K. Fukuda ; H. Matsuhata

Pub. info.:	Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007. pp.783-786, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	600-603

Conference Proceedings

8. Negative Field Reliability of ONO Gate Dielectric on 4H-SiC

S. Tanimoto ; T. Suzuki ; S. Yamagami ; H. Tanaka ; T. Hayashi

Pub. info.:	Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007. pp.795-798, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	600-603

Conference Proceedings

9. Study of Signal Processing for EMAT

Y. Nishimura ; S. Akira ; T. Suzuki

Pub. info.:	Applied electromagnetic engineering : for magnetic superconducting and nanomaterials : Selected, peer reviewed papers from the 6th Japanese-Mediterranean Workshop on Applied Electromagnetic Engineering for Magnetic Superconducting and Nano Materials, organized in Bucharest, Romania in July 27-29 2009. pp.345-354, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	670

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Conference Proceedings

10. Reliability of 4H-SiC(000-1) MOS Gate Oxide Using N₂O Nitridation

T. Suzuki ; J. Senzaki ; T. Hatakeyama ; K. Fukuda ; T. Shinohe

Pub. info.:	Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain. pp.557-560, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	615-617

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Author: T. Suzuki