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18 results

Conference Proceedings

1. Single Metal/Dual High-κ CMISFETs without High-κ-induced Vth Variation by MgO or Al2O3 Incorporation

N. Mise ; T. Morooka ; T. Eimori ; T. Ono ; Y. Nara

Pub. info.:	Physics and technology of high-k gate dielectrics 6. pp.11-18, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(5)

Conference Proceedings

2. Importance of SiC Stacking to Interlayer States at the SiC/SiO₂ Interface

C.J. Kirkham ; T. Ono

Pub. info.:	Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy. pp.457-460, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	858

Conference Proceedings

3. Development of Porous Material with High Young's Modulus and Low Thermal Expansion Coefficient in SiC-Vitrified Bonding Material-LiAlSiO₄ System

T. Ono ; K. Matsumaru ; I. Juárez-Ramírez ; L.M. Torres-Martínez ; K. Ishizaki

Pub. info.:	Eco-materials processing and design X : selected peer reviewed papers from the 10th International Symposium on Eco-Materials Processing and Design, ISEPD, Xian, China, January 13-15, 2009. pp.715-718, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	620-622

Conference Proceedings

4. A Hydro-Fluoro Hybrid Compound, Hermaphrodite, Is Fluorophilic or Fluorophobic? A New Concept for the Fluorine-Based Crystal Engineering

T. Ono ; H. Hayakawa ; N. Yasuda ; H. Uekusa ; Y. Ohashi

Pub. info.:	Current fluoroorganic chemistry : new synthetic directions, technologies, materials, and biological applications. pp.170-189, 2007. Washington, DC. American Chemical Society
Title of ser.:	ACS symposium series
Ser. no.:	949

Conference Proceedings

5. The Interaction of Oil Body and Protein in Soymilk Making

Y. Chen ; T. Ono

Pub. info.:	Chemistry, texture, and flavor of soy. pp.103-112, 2010. Washington, DC. American Chemical Society
Title of ser.:	ACS symposium series
Ser. no.:	1059

Conference Proceedings

6. Wafer Strength and Slip Generation Behavior in 300mm Wafers

T. Ono ; W. Sugimura ; T. Kihara ; M. Hourai

Pub. info.:	Silicon materials science and technology X. pp.109-122, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(2)

Conference Proceedings

7. Defect Formation Behaviors in Heavily Doped Czochralski Silicon

W. Sugimura ; T. Ono ; S. Umeno ; M. Hourai ; K. Sueoka

Pub. info.:	Silicon materials science and technology X. pp.95-108, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(2)

Conference Proceedings

8. Development of SOFC Residential Cogeneration System at Osaka Gas and Kyocera

M. Suzuki ; T. Sogi ; K. Higaki ; T. Ono ; N. Takahashi ; K. Shimazu ; T. Shigehisa

Pub. info.:	Solid oxide fuel cells 10 (SOFC-X). pp.27-30, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	7(1)

Conference Proceedings

9. Standardization of Characterization of Bulk Microdefects and Denuded Zones in Annealed CZ Si

R. Takeda ; N. Inoue ; K. Moriya ; K. Kashima ; K. Nakashima ; M. Kato ; S. Kitagawa ; T. Ono ; H. Urushido ; N. Nango ; V. Akhmetov

Pub. info.:	Silicon materials science and technology X. pp.471-484, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(2)

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Conference Proceedings

10. Study on irradiation damage to semiconductor devices by 200-keV electrons caused by backscattered electron assisting LSI inspection (BEASTLI) method

S. Yamada ; T. Ono ; F. Mizuno

Pub. info.:	Integrated circuit metrology, inspection, and process control IX : 20-22 February 1995, Santa Clara, California. pp.374-382, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2439

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