1.

Conference Proceedings
Conference Proceedings
1. Reverse Electrical Characteristics of 4H-SiC JBS Diodes Fabricated on In-House Substrate with Low Threading Dislocation Density
H. Fujiwara ; M. Konishi ; T. Ohnishi ; T. Nakamura ; K. Hamada
Pub. info.: Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd.  pp.694-697,  2011.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 679-680
2.

Conference Proceedings
Conference Proceedings
2. Growth at High Rates of Epitaxial YBCO Film Assisted by Liquid Phase
T. Ohnishi ; J. U. Huh ; W. Jo ; R. H. Hammond
Pub. info.: Epitaxial growth of functional oxides : proceedings of the international symposium.  pp.299-312,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-29
3.

Technical Paper
Technical Paper
3. Astrodynamics Science About Itokawa, Gravity and Ephemeris
M. Yoshikawa ; H. Ikeda ; H. Yano ; J. Saito ; T. Kubota ; T. Hashimoto ; A. Fujiwara ; J. Kawaguchi ; T. Kominato ; M. Matsuoka ; K. Shirakawa ; T. Ohnishi ; S. Abe ; T. Mukai ; R. Gaskell ; D. Scheeres
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Astrodynamics Specialist Conference
Ser. no.: 2006
4.

Conference Proceedings
Conference Proceedings
4. Proton beam deflection using silicon crystal at the KEK proton synchrotron
S. Strokov ; V. Biryukov ; Y. Chesnokov ; I. Endo ; M. Iinuma ; H. Kuroiwa ; T. Ohnishi ; H. Sato ; S. Sawada ; T. Takahashi ; K. Ueda
Pub. info.: International conference on charged and neutral particles channeling phenomena II : 3-7 July 2006, Rome, Italy.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6634