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36 results

Conference Proceedings

1. Multi-scale Simulation Approach for Polymer Electrolyte Fuel Cell Cathode Design

M. Koyama ; D. Kim ; B. Kim ; T. Hattori ; A. Suzuki

Pub. info.:	Proton exchange membrane fuel cells 8. pp.57-66, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(2)

Conference Proceedings

2. Control of Onset of Buckling Lobe in Axial Impact of Square Tube

M. Yamashita ; T. Okuyama ; N. Nishimura ; T. Hattori

Pub. info.:	Explosion, shock wave and hypervelocity phenomena in materials II : selected peer reviewed papers from the 2nd International Symposium on Explosion, Shock Wave and Hypervelocity Phenomena (ESHP-2), 6-9 March 2007, Kumamoto, Japan. pp.173-178, 2008. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	566

Conference Proceedings

3. Evolution of Silicon Cleaning Technology Over the Last Twenty Years

J. Ruzyllo ; T. Hattori ; R.E. Novak ; P. Mertens ; P. Besson

Pub. info.:	Cleaning and surface conditioning technology in semiconductor device manufacturing 10. pp.3-7, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(2)

Conference Proceedings

4. Change in Mechanical Strength and Bone Contact Ratio of Beta-Type TNTZ Subjected to Mechanical Surface Modification

T. Akahori ; T. Hattori ; H. Fukui ; M. Niinomi

Pub. info.:	THERMEC 2016 : selected peer reviewed papers from the 9th International Conference on Processing & Manufacturing of Advanced Materials, May 29 - June 03, 2016, Graz, Austria. pp.2371-2376, 2017. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	879

Conference Proceedings

5. Angle-Resolved Photoelectron Spectroscopy Study on Ultrathin Gate Dielectrics

H. Nohira ; T. Hattori

Pub. info.:	ULSI process integration 5. pp.183-194, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(6)

Conference Proceedings

6. Impact Behavior of Biaxially Compressed Wood

M. Yamashita ; N. Sawada ; T. Hattori

Pub. info.:	Explosion, shock wave and high energy reaction phenomena : selected, peer reviewed papers from International Symposium on Explosion, Shock wave & High-energy reaction Phenomena 2010 (3rd ESHP Symposium), 1-3 September 2010, Seoul National University, Seoul, Korea. pp.247-252, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	673

Conference Proceedings

7. Trial Computation of Dynamic Axial Compression of Adhesive-Bonded Tubular Structure

M. Yamashita ; N.T. Kien ; T. Hattori

Pub. info.:	Explosion, shock wave and high energy reaction phenomena : selected, peer reviewed papers from International Symposium on Explosion, Shock wave & High-energy reaction Phenomena 2010 (3rd ESHP Symposium), 1-3 September 2010, Seoul National University, Seoul, Korea. pp.253-258, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	673

Conference Proceedings

8. Fabrication of X-ray Grating Using X-ray Lithography Technique

D. Noda ; H. Tsujii ; N. Takahashi ; T. Hattori

Pub. info.:	Microfabricated and Nanofabricated Systems for MEMS/NEMS 8, at 214th ECS Meeting, October 12-17, 2008, Honolulu, Hawaii, USA. pp.97-102, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(14)

Conference Proceedings

9. Thermal Stability of LaOx/Si Interfacial Transition Layer

H. Nohira ; T. Yoshida ; H. Okamoto ; W. Sakai ; K. Nakajima ; M. Suzuki ; K. Kimura ; N. J. Aun ; Y. Kobayashi ; S. Obmi ; H. Iwai ; E. Ikenaga ; K. Kobayashi ; Y. Takata ; T. Hattori

Pub. info.:	Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5. pp.87-96, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(1)

10.

Conference Proceedings

10. High-Resolution X-Ray Photoelectron Spectroscopy Study on Si₃N₄/Si Interface Structures and Its Correlation with Hysteresis in C(V) Curves

M. Higuchi ; A. Teramoto ; M. Komura ; S. Shinagawa ; E. Ikenaga ; H. Nohira ; K. Kobayashi ; T. Hattori ; S. Sugawa ; T. Ohmi

Pub. info.:	Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5. pp.267-276, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(1)

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Author: T. Hattori