1.
Conference Proceedings
S. Barnola ; C. Vizioz ; N. Vulliet ; C. Dupré ; T. Ernst
Pub. info.:
SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices . pp.923-934, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
16(10)
2.
Conference Proceedings
C. Dupre ; P. Fazzini ; T. Ernst ; F. Cristiano ; J. Hartmann ; A. Claverie ; F. Andrieu ; O. Faynot ; P. Rivallin ; F. Laugier ; G. Ghibaudo ; S. Cristoloveanu ; S. Deleonibus
Pub. info.:
Silicon-on-insulator technology and devices 13 . pp.33-38, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
6(4)
3.
Technical Paper
M. Lang ; H. Baier ; T. Ernst
Pub. info.:
AIAA meeting papers on disc . 2006. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:
2006
4.
Conference Proceedings
J. Hartmann ; A. Papon ; J. Colonna ; T. Ernst ; T. Billon
Pub. info.:
SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices . pp.341-351, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:
ECS transactions
Ser. no.:
16(10)
5.
Conference Proceedings
E. Noesekabel ; T. Ernst ; W. Haefker
Pub. info.:
Optical Measurement Systems for Industrial Inspection V . 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6616