Interconnect and contact metallization for ULSI : proceedings of the international symposium. pp.251-260, 1999. Pennington, N.J.. Electrochemical Society
Interconnect and contact metallization for ULSI : proceedings of the international symposium. pp.232-240, 1999. Pennington, N.J.. Electrochemical Society
Chang, T.-C. ; Liu, P.-T. ; Su, H. ; Chang, C.-F. ; Yang, Y.-L. ; Sze, S.M. ; Hou, J. ; Chung, H.
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Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium. pp.72-89, 2000. Pennington, N.J.. Electrochemical Society
Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium. pp.114-132, 2000. Pennington, N.J.. Electrochemical Society
Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium. pp.133-143, 2000. Pennington, N.J.. Electrochemical Society
Proceedings of the Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices and the twentieth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XX). pp.240-246, 1994. Pennington, NJ. Electrochemical Society