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20 results

Conference Proceedings

1. Wavelength dependence of laser cleaning for field emitter arrays

Takai,M. ; Suzuki,N. ; Yavas,O. ; Hosono,A. ; Okuda,S.

Pub. info.:	Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore. pp.302-307, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4426

Conference Proceedings

2. Semiconductor nanocrystallite formation using inert gas ambient pulsed laser ablation and its application to light-emitting devices

Yoshida,T. ; Yamada,Y. ; Suzuki,N. ; Makino,T. ; Orii,T. ; Onai,S.

Pub. info.:	Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California. pp.465-474, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3618

Conference Proceedings

3. High-spectral-purity and high-durability kHz KrF excimer laser with advanced rf preionization discharge

Enami,T. ; Wakabayashi,O. ; Nishisaka,T. ; Suzuki,N. ; Nire,T. ; Mizoguchi,H. ; Nakarai,H. ; Tanaka,H. ; Ariga,T. ; Shio,K. ; Okamoto,T. ; Noudomi,R. ; Tomaru,H. ; Nakao,K.

Pub. info.:	Optical microlithography XI : 25-27 February 1998, Santa Clara, California. pp.1031-1040, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3334

Conference Proceedings

4. Intersubband transition in AlGaN-GaN quantum wells for ultrafast all-optical switching at communication wavelength

Suzuki,N. ; Iizuka,N. ; Kaneko,K.

Pub. info.:	Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California. pp.127-138, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3940

Conference Proceedings

5. Crystallinities and light-emitting properties of nanostructured SiGe alloy prepared by pulsed laser ablation in inert background gases

Yoshida,T. ; Yamada,Y. ; Suzuki,N. ; Makino,T. ; Orii,M.T. ; Murakami,K. ; Geohegan,D.B. ; Lowndes,D.H. ; Aziz,M.J.

Pub. info.:	Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California. pp.512-519, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3618

Conference Proceedings

6. Nondestructive Measurement of Grain Size in Steel Plates by Using Magnetic Coercive Force

Yoshino,M. ; Tanabe,H. ; Sakamoto,T. ; Suzuki,N. ; Yaji,Y.

Pub. info.:	Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995. pp.45-54, 1996. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	210-213

Conference Proceedings

7. Electronic Structure and Bonding Nature of Intercalation Compounds of IT-type TiS2

Motizuki,K. ; Suzuki,N.

Pub. info.:	Intercalation compounds : ISIC-6 : proceedings of the 6th International Conference on Intercalation Compounds, May 27-31, 1991, Orleans, France. Pt.1 pp.381-386, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	91-93

Conference Proceedings

8. High-NA high-throughput scanner compatible 2-kHz KrF excimer laser for DUV lithography

Nakarai,H. ; Hisanaga,N. ; Suzuki,N. ; Matsunaga,T. ; Asayama,T. ; Akita,I. ; Igarashi,T. ; Ariga,T. ; Bushida,S. ; Enami,T. ; Nodomi,R. ; Takabayashi,Y. ; Sakanishi,S. ; Suzuki,T. ; Nakao,K.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part2 pp.1481-1490, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

9. Output stabilization technology With chemical impurity control on ArF excimer laser

Sumitani,A. ; Andou,S. ; Watanabe,T. ; Konishi,M. ; Egawa,S. ; Uchino,I. ; Ohta,T. ; Terashima,K. ; Suzuki,N. ; Enami,T. ; Mizoguchi,H.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part2 pp.1424-1434, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

10.

Conference Proceedings

10. Nondestructive Measurement of Grain Size in Steel Plate by Ultrasonic Attenuation

Yamano,M. ; Ichikawa,F. ; Okuno,M. ; Suzuki,N. ; Iizuka,Y.

Pub. info.:	Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995. pp.759-766, 1996. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	210-213

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