Optical measurement systems for industrial inspection II : application in production engineering : 20-21 June 2001 Munch, Germany. pp.66-74, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.50-53, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Nonimaging optics, maximum efficiency light transfer VI : 2-3 August 2001 San Diego, USA. pp.152-157, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nonimaging optics, maximum efficiency light transfer VI : 2-3 August 2001 San Diego, USA. pp.158-160, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California. pp.260-269, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Liquid crystal materials, devices, and flat panel displays : 27-28 January 2000, San Jose, California. pp.120-131, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of advances in fluorescence sensing technology IV : 24-27 January 1999, San Jose, California. pp.379-390, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.104-107, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.82-85, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA. pp.369-377, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering