Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 results

Conference Proceedings

1. High-speed progressive operation of a 2M-pixel M-FIT CCD

Shimamoto,H. ; Sugawara,M. ; Okano,F. ; Suzuki,S.

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.205-209, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4306

Conference Proceedings

2. Ultrahigh-definition experimental camera system with an 8M-pixel CCD

Mitani,K. ; Sugawara,M. ; Shimamoto,H. ; Smith,C.R. ; Farrier,M.G. ; Tang,Q. ; Okano,F.

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA. pp.198-204, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3965

Conference Proceedings

3. Temperature characteristics of light emission spectra and threshold currents of columnar-shaped self-assembled InGaAs/GaAs quantum-dot lasers

Sugawara,M. ; Mukai,K. ; Nakata,Y.

Pub. info.:	In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.252-259, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3628

Conference Proceedings

4. Attenuated phase-shifting mask specification with modified beam illumination

Kagami,I. ; Sugawara,M. ; Kawahira,H. ; Tsudaka,K. ; Ishikawa,K. ; Nozawa,S.

Pub. info.:	15th Annual BACUS Symposium on Photomask Technology and Management. pp.445-456, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2621

Conference Proceedings

5. Defect printability study of attenuated phase-shifting masks for specifying inspection sensitivity

Sugawara,M. ; Ishikawa,K. ; Kawahira,H. ; Kagami,I. ; Nozawa,S.

Pub. info.:	15th Annual BACUS Symposium on Photomask Technology and Management. pp.457-472, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2621

Conference Proceedings

6. Chemically amplified resist process for 0.25-ｦﾌm-generation photomasks

Katsumata,M. ; Kawahira,H. ; Sugawara,M. ; Nozawa,S.

Pub. info.:	16th Annual BACUS Symposium on Photomask Technology and Management. pp.83-91, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2884

Conference Proceedings

7. 2/3-in.2-M-pixel CCD with progressive scan capability

Sugawara,M. ; Nagayoshi,R. ; Fujita,Y. ; Itakura,K.

Pub. info.:	22nd International Congress on High-Speed Photography and Photonics. pp.453-462, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2869

Conference Proceedings

8. Influence of process latitude on exposure characteristics

Sugawara,M. ; Kawahira,H. ; Nozawa,S.

Pub. info.:	Optical Microlithography IX. Part2 pp.583-597, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2726

Conference Proceedings

9. Effect of carrier dynamics on quantum-dot laser performance and the possibility of bi-exciton lasing (Invited Paper)

Sugawara,M.

Pub. info.:	Physics and Simulation of Optoelectronic Devices VI. Part 1 pp.88-99, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3283

10.

Conference Proceedings

10. Chemically amplified resist process for 0.25-ｦﾌm generation photomasks

Katsumata,M. ; Kawahira,H. ; Sugawara,M. ; Nozawa,S.

Pub. info.:	Photomask and X-Ray Mask Technology III. pp.96-104, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2793

Select: Check all | Remove all

Sort order

10 results

Filtering by:

Author: Sugawara,M.