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18 results

Conference Proceedings

1. Dynamic Characteristics of 4H-SiC pin Dlode on (000-1)C-Face with Small Forward Degradation

Nakayama, K. ; Sugawara, Y. ; Ishii, R. ; Tsuchida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.1359-1362, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

2. Comparison of Propagation and Nucleation of Basal Plane Dislocations in 4H-SiC(000-1) and (0001) Epitaxy

Tsuchida, H. ; Kamata, I. ; Miyanagi, T. ; Nakamura, T. ; Nakayama, K. ; Ishii, R. ; Sugawara, Y.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.231-234, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

3. Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping

Miyanagi, T. ; Tsuchida, H. ; Kamata, I. ; Nakamura, T. ; Ishii, R. ; Nakayama, K. ; Sugawara, Y.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.375-378, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

4. Advances in SiC GTO Development and Its Applications

Sugawara, Y.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.1391-1396, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

Conference Proceedings

5. Effects of Microstructure in Catalyst Layer on the Performance of PEFC

Morita, J. ; Yasumoto, E. ; Sugawara, Y. ; Uchida, M. ; Gyoten, H.

Pub. info.:	Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan. pp.959-962, 2001. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	132

Conference Proceedings

6. Investigation of Basal Plane Dislocations in the 4H-SiC Epilayers Grown on {0001} Substrates

Tsuehida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T. ; Izumi, K. ; Nakayama, K. ; Ishii, R. ; Asano, K. ; Sugawara, Y.

Pub. info.:	Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy. pp.97-100, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	483-485

Conference Proceedings

7. Atomic Scale Origins of Force Interaction

Morita, S. ; Sugawara, Y. ; Yokoyama, K. ; Uchihashi, T.

Pub. info.:	Fundamentals of tribology and bridging the gap between the macro- and micro/nanoscales. pp.103-120, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	10

Conference Proceedings

8. Frictional-Force Imaging and Friction Mechanisms with a Lattice Periodicity

Morita, S. ; Sugawara, Y. ; Yokoyama, K. ; Fujisawa, S.

Pub. info.:	Fundamentals of tribology and bridging the gap between the macro- and micro/nanoscales. pp.83-102, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	10

Conference Proceedings

9. True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy

Sugawara, Y. ; Ueyama, H. ; Uchihashi, T. ; Ohta, M. ; Yanase, Y. ; Shigematsu, T. ; Suzuki, M. ; Morita, S.

Pub. info.:	Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.15-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	442

10.

Conference Proceedings

10. 5.0 kV 4H-SiC SEMOSFET with Low RonS of 88 m Ω cm2

Sugawara, Y. ; Asano, K. ; Takayama, D. ; Ryu, S. ; Singh, R. ; Palmour, J. ; Hayashi, T.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1199-1202, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

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Author: Sugawara, Y.