1.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Ikeda,N. ; Yamamoto,T. ; Kobayashi,S.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.523-524,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
2.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Akatsuka,M. ; Onno,T. ; Asayama,E. ; Koike,Y. ; Adachi,N. ; Sadamitsu,S. ; Katahama,H.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  4218  pp.164-179,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Akatsuka,M. ; Nishihara,K. ; Yamamoto,T. ; Kobayashi,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1737-1742,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201