1.

Conference Proceedings
Conference Proceedings
1. Protein dynamics studied by room-temperature phosphorescence spectroscopy
Subramaniam,V. ; Schlyer,B.D. ; Gafni,A. ; Steel,D.G.
Pub. info.: Proceedings of advances in optical biophysics : 25-26 January 1998, San Jose, California.  pp.243-251,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3256
2.

Conference Proceedings
Conference Proceedings
2. Yield-limiting NMOSFET gate depletion in a deep submicrometer CMOS process
Karnett,M.P. ; Qian,S. ; Mitchell,T. ; Subramaniam,V. ; Sur,H. ; Haby,B.J. ; Brugge,H.B.
Pub. info.: Challenges in process integration and device technology : 18-19 September 2000, Santa Clara, USA.  pp.191-199,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4181
3.

Conference Proceedings
Conference Proceedings
3. Use of near-field scanning optical microscopy(NSOM)to characterize optical channel waveguide structures
Naghski,D.H. ; Lindsay,S.M. ; Poweleit,C.D. ; Brabander,G.N.De ; Subramaniam,V. ; Jackson,H.E. ; Boyd,J.T.
Pub. info.: Integrated Optics and Microstructures III.  pp.64-72,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2686
4.

Conference Proceedings
Conference Proceedings
4. Influence of metal deposition temperature on deep-submicrometer metal lithography
Subramaniam,V. ; Siems,D.D. ; Karnett,M.P. ; Maheshwary,S.R. ; Sur,H.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.298-305,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884