1.

Conference Proceedings
Conference Proceedings
1. Enabling technologies for plastic displays
Sturm, J. C. ; Gleskova, H. ; Jackson, T. N. ; Fonash, S. J. ; Wagner, S.
Pub. info.: Cockpit displays IX : displays for defense applications : 2-5 April 2002, Orlando, [Florida].  pp.222-236,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4712
2.

Conference Proceedings
Conference Proceedings
2. Integrated Amorphous and Polycrystalline Silicon TFTs With a Single Silicon Layer
Chen, Y. ; Pangal, K. ; Sturm, J. C. ; Wagner, S.
Pub. info.: Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A..  pp.629-634,  1999.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 557
3.

Conference Proceedings
Conference Proceedings
3. Doped Organic Light-Emitting Diodes Based on Random Copolymers Containing Both Hole and Electron Transport Groups
Jiang, X. ; Killeen, K. A. ; Pschenitzka, F. ; Register, R. A. ; Sturm, J. C. ; Thompson, M. E.
Pub. info.: Flat-panel displays and sensors - principles, materials and processes : symposium held April 4-9, 1999, San Francisco, California, U.S.A..  pp.433-438,  2000.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 558
4.

Conference Proceedings
Conference Proceedings
4. ELECTRON-BEAM-INDUCED-CURRENT (EBIC) IMAGING OF DEFECTS IN Si1-XGeX MULTILAYER STRUCTURES
Sturm, J. C. ; Xiao, X. ; Garone, P. M. ; Schwartz, P. V.
Pub. info.: Chemistry and defects in semiconductor heterostructures.  pp.341-346,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 148
5.

Conference Proceedings
Conference Proceedings
5. *PERFORMANCE ADVANTAGES OF SUBMICRON SILICON-ON-INSULATOR DEVICES FOR ULSI
Sturm, J. C.
Pub. info.: Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.295-308,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 107
6.

Conference Proceedings
Conference Proceedings
6. Effects of Reflective Surfaces on Silicon Emissivity and Temperature Measurements
Xu, H. ; Sturm, J. C.
Pub. info.: Rapid thermal and integrated processing V : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.297-,  1996.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 429
7.

Conference Proceedings
Conference Proceedings
7. Suppression of Boron Transient-Enhanced Diffusion in SiGe HBTs by Carbon Incorporation
Lanzerotti, L. D. ; Sturm, J. C. ; Stach, E. ; Hull, R. ; Buyuklimanli, T. ; Magee, C.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.297-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
8.

Conference Proceedings
Conference Proceedings
8. SCHOTTKY BARRIER HEIGHTS OF Pt SILICIDES ON SiGe
Jimenez, J. R. ; Xiao, X. ; Sturm, J. C. ; Pellegrini, P. W. ; Chi, M.
Pub. info.: Silicides, germanides, and their interfaces : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.293-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 320
9.

Conference Proceedings
Conference Proceedings
9. Low Temperature (｡？00｡？ Silicon Pyrometry at 1.1 ｦﾌm with Emissivity Correction
Sturm, J. C. ; Reddy, A.
Pub. info.: Rapid thermal and integrated processing IV : symposium held April 17-20, 1995, San Francisco, California, U.S.A..  pp.137-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 387
10.

Conference Proceedings
Conference Proceedings
10. Quantitative Measurement of Reduction of Phosphorus Diffusion by Substitutional Carbon Incorporation
Carroll, M. S. ; Sturm, J. C. ; Chang, C-L.
Pub. info.: Si front-end processing - physics and technology of dopant-defect interactions : symposium held April 6-9, 1999, San Francisco, California, U.S.A..  pp.181-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 568