1.

Conference Proceedings

Conference Proceedings
Kang,J.U. ; Villeneuve,A. ; Aitchison,J.S. ; Stegeman,G.I.
Pub. info.: Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California.  pp.53-64,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3940
2.

Conference Proceedings

Conference Proceedings
Duff,A.-C.Le ; Canva,M. ; Pliska,T. ; Chaput,F. ; Toussaere,E. ; Stegeman,G.I. ; Boilot,J.-P. ; Levy,Y. ; Brun,A.
Pub. info.: Linear, nonlinear, and power-limiting organics : 31 July-3 August 2000, San Diego, USA.  pp.21-30,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4106
3.

Conference Proceedings

Conference Proceedings
Canva,M. ; Galvan-Gonzalez,A. ; Stegeman,G.I. ; Twieg,R.J. ; Chan,P. ; Kowalczyk,T.C. ; Lackritz,H.
Pub. info.: Linear, nonlinear, and power-limiting organics : 31 July-3 August 2000, San Diego, USA.  pp.104-114,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4106
4.

Conference Proceedings

Conference Proceedings
Yilmaz,S. ; Wirges,W. ; Brinker,W. ; Bauer-Gogonea,S. ; Bauer,S. ; Jager,M. ; Stegeman,G.I. ; Ahlheim,M. ; Stahelin,M. ; Zysset,B. ; Lehr,F. ; Diemeer,M.B. ; Flipse,M.C.
Pub. info.: Optoelectronic Integrated Circuits.  pp.382-389,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3006
5.

Conference Proceedings

Conference Proceedings
Kang,J.U. ; Stegeman,G.I. ; Aitchison,J.S.
Pub. info.: Photonic Component Engineering and Applications.  pp.130-133,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2749