1.

Conference Proceedings

Conference Proceedings
Hobson,W.S. ; McAfee,S.R. ; Jones,K.S. ; Paroskevopoulos,N.C. ; Abernathy,C.R. ; Sputz,S.K. ; Harris,T.D. ; Schnoes,M.Lamont ; Pearton,S.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.1063-1068,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Johnson,J.E. ; Morton,P.A. ; Park,Y.K. ; Ketelsen,L.J.P. ; Grenko,J.A. ; Miller,T.J. ; Sputz,S.K. ; Tanbun-Ek,T. ; Vandenberg,J.M. ; Yadvish,R.D. ; Fullowan,T.R. ; Sciortino,P.F.,Jr. ; Sergent,A.M. ; Tsang,W.T.
Pub. info.: High-Speed Semiconductor Lasers for Communication.  pp.30-38,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3038
3.

Conference Proceedings

Conference Proceedings
Hybertsen,M.S. ; Baraff,G.A. ; Sputz,S.K. ; Ackerman,D.A. ; Shtengel,G.E. ; Vandenberg,J.M. ; Lum,R. ; ,C.L.Reynolds,Jr. ; Leibovitch,M. ; Pollak,F.H.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.430-441,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693