Contini, D. ; Pifferi, A. ; Spinelli, L. ; Torricelli, A. ; Cubeddu, R.
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Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590U-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Grosenick, D. ; Wassermann, B. ; Macdonald, R. ; Rinneberg, H. ; Torricelli, A. ; Spinelli, L. ; Cubeddu, R.
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Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590M-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Taroni, P. ; Pifferi, A. ; Spinelli, L. ; Torricelli, A. ; Danesini, G.M. ; Cubeddu, R.
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Photon migration and diffuse-light imaging : 22-23 June 2003, Munich, Germany. pp.1-5, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Cubeddu, R. ; Pifferi, A. ; Spinelli, L. ; Taroni, P. ; Torricelli, A.
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Photon migration and diffuse-light imaging : 22-23 June 2003, Munich, Germany. pp.23-28, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Chilla, J. ; Butterworth, S. ; Zeitschel, A. ; Charles, J. ; Caprara, A. ; Reed, M. ; Spinelli, L.
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Solid state lasers XIII : technology and devices : 27-29 January 2004, San Jose, California, USA. pp.143-150, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lynch, S. ; Spinelli, L. ; Sherlock, M. ; Barrett, J. ; Crean, G. M.
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Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.39-, 1994. Pittsburgh. MRS - Materials Research Society
Maggipinto, T. ; Brambilla, M. ; Perrini, I.M. ; Spinelli, L. ; Tissoni, G.
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ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage. pp.217-226, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering