1.

Conference Proceedings
Conference Proceedings
1. Orbital measurement and verification of the Chandra X-ray Observatory's PSF
Jerius,D. ; Donnelly,R.H. ; Tibbetts,M.S. ; Edgar,R.J. ; Gaetz,T.J. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Zhao,P.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.17-27,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
2.

Conference Proceedings
Conference Proceedings
2. Chandra X-ray Observatory(CXO):overview
Weisskopf,M.C. ; Tananbaum,H.D. ; Speybroeck,L.P.Van ; O'Dell,S.L.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.2-16,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
3.

Conference Proceedings
Conference Proceedings
3. Absolute effective area of the Chandra high-resolution mirror assembly(HRMA)
Schwartz,D.A. ; David,L.P. ; Donnelly,R.H. ; Edgar,R.J. ; Gaetz,T.J. ; Graessle,D.E. ; Jerius,D. ; Juda,M. ; Kellogg,E.M. ; McNamara,B.R. ; Plucinsky,P.P. ; Speybroeck,L.P.Van ; Wargelin,B.J. ; Wolk,S. ; Dewey,D. ; Marshall,H.L. ; Schulz,N.S. ; Elsner,R.F. ; Kolodziejczak,J.J.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.28-40,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
4.

Conference Proceedings
Conference Proceedings
4. Orbital verification of the CXO high-resolution mirror assembly alignment and vignetting
Gaetz,T.J. ; Jerius,D. ; Edgar,R.J. ; Speybroeck,L.P.Van ; Schwartz,D.A. ; Markevitch,M.L. ; Taylor,S.C. ; Schulz,N.S.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.41-52,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings
Conference Proceedings
5. Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
Clark,A.M. ; Bruni,R.J. ; Romaine,S.E. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Yip,P.W. ; Drehman,A.J. ; Shapiro,A.P.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.268-276,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
6.

Conference Proceedings
Conference Proceedings
6. Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples
Bruni,R.J. ; Clark,A.M. ; Moran,J.F. ; Nguyen,D.T. ; Romaine,S.E. ; Schwartz,D.A. ; Speybroeck,L.P.Van
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.301-310,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
7.

Conference Proceedings
Conference Proceedings
7. Development of Constellation-X optics technologies at MSFC
O'Dell,S.L. ; Jones,W.D. ; Ramsey,B.D. ; Engelhaupt,D.E. ; Smith,W.S. ; Cohen,L.M. ; Speybroeck,L.P.Van
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.316-327,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
8.

Conference Proceedings
Conference Proceedings
8. Constellation-X Spectroscopy X-ray Telescope requirements and development program:MSFC research program
O'Dell,S.L. ; Jones,W.D. ; Russell,J.K. ; Ramsey,B.D. ; Engelhaupt,D.E. ; Cohen,L.M. ; Speybroeck,L.P.Van
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.73-81,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
9.

Conference Proceedings
Conference Proceedings
9. Monitoring program for the coating of the AXAF flight optics
Romaine,S.E. ; Bruni,R.J. ; Clark,A.M. ; Podgorski,W.A. ; Schultz,D. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Zhou,Y. ; Hahn,R.E. ; Johnston,G.T. ; Longmire,A.J. ; Humphreys,J.T. ; Shapiro,A.P. ; Tjulander,R.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.8-17,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
10.

Conference Proceedings
Conference Proceedings
10. Advanced X-Ray Astrophysics Facility(AXAF)
Weisskopf,M.C. ; O'Dell,S.L. ; Speybroeck,L.P.Van
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.2-7,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805