1.

Conference Proceedings
Conference Proceedings
1. THE STRUCTURE OF THERMAL DONORS (NL8) IN SILICON: A MODEL DERIVED FROM 17O AND 29Si ENDOR EXPERIMENTS
Michel, J. ; Niklas, J. R. ; Spaeth, J. -M.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.185-188,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. *ENDOR SPECTROSCOPY ON DEEP LEVEL DEFECTS IN GaAs
Spaeth, J. -M. ; Gorger, A. ; Hofmann, D. M. ; Meyer, B. K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.363-374,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. Electron Paramagnetic Resonance of the Scandium Acceptor in 4H and 6H Silicon Carbide
Greulich-Weber, S. ; Marz, M. ; Spaeth, J. -M. ; Mokhov, E. N. ; Kalabukhova, E. N.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.809-812,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
4.

Conference Proceedings
Conference Proceedings
4. Donors and Acceptors in SiC - Studies with EPR and ENDOR
Spaeth, J. -M.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.785-790,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)