Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.31-36, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA. pp.462-466, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical diagnostic, guidance, and surgical-assist systems II : 25-26 January 2000, San Jose, California. pp.210-216, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics of biological fluids V : 27 January 2000, San Jose, USA. pp.44-53, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Spectral imaging : instrumentation, applications, and analysis : 25 January 2000, San Jose, California. pp.67-73, 2000. Bellingham. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics and sensing of biological fluids and glucose and cholesterol monitoring : 22-23 January 2001, San Jose, USA. pp.161-169, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
de Leeuw,G. ; Neele,F.P. ; van Eijk,A.M.J. ; Vignati,E. ; Hill,M.K. ; Smith,M.H.
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Propagation and imaging through the atmosphere : 29-31 July 1997, San Diego, California. pp.14-27, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of ophthalmic technologies IX : 23-25 January 1999, San Jose, California. pp.114-120, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA. pp.202-213, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA. pp.55-64, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering