1.

Conference Proceedings
Conference Proceedings
1. Electrical Characterization of Ion Implant Charging
Smith, T.C.
Pub. info.: Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.1-11,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-33
2.

Technical Paper
Technical Paper
2. Rotational Relaxation Rate constants of CO-He Using Infrared Double Resonance.
Smith, T.C. ; Hostuler, D.A. ; Hager, G.D.
Pub. info.: AIAA paper.  2003.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Fluid Dynamics Conference
Ser. no.: 2003
3.

Technical Paper
Technical Paper
3. State to State Rotational Relaxatio Rate Constants for Co-Ne Using the Technique of Ir-Ir Double Resonance. Comparing Theor to Experiment
Hostutler, D.A. ; Smith, T.C. ; Hager, G.D. ; McBane, G.C. ; Heaven, M.C.
Pub. info.: AIAA paper.  2003.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Plasmadynamics and Lasers Conference
Ser. no.: 2003
4.

Conference Proceedings
Conference Proceedings
4. Pulsed tunable single-frequency OPO for optical pumping of CO
Brown, A.J.W. ; Smith, T.C. ; Hostutler, D.A. ; Hager, G.D. ; Norsen, M. ; Bowers, M.S. ; Kimura, W.D.
Pub. info.: Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications II.  pp.82-89,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4972
5.

Conference Proceedings
Conference Proceedings
5. State-to-state rotational relaxation rate constants for the CO+X series (X=CO, He, and Ne) using IR-IR double resonance experiments: comparing theory to experiment
Hostutler, D.A. ; Smith, T.C. ; Hager, G.D. ; McBane, G.C. ; Heaven, M.C.
Pub. info.: High-Power Laser Ablation V.  pp.906-917,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5448