1.

Conference Proceedings
Conference Proceedings
1. MICROSTRUCTURES IN Y-Ba-Cu-O THIN FILMS INVESTIGATED BY XAFS TECHNIQUES
Krol, A. ; Ming, Z.H. ; Lin, C.S. ; Soo, Y.L. ; Gu, C.X. ; Kao, Y.H. ; Narumi, E. ; Shaw, D.T. ; Smith, G.C.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.873-876,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
2.

Conference Proceedings
Conference Proceedings
2. SOFT X-RAY STUDIES OF Y-Ba-Cu-O THIN FILMS PREPARED BY LASER ABLATION
Krol, A. ; Sher, C.J. ; Storch, D.R. ; Song, L.W. ; Kao, Y.H. ; Witanachi, S. ; Zhu, Y.Z. ; Patel, S. ; Shaw, D.T. ; Smith, G.C.
Pub. info.: High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.505-508,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 169
3.

Conference Proceedings
Conference Proceedings
3. Advanced two-dimensional thermal neutron detectors for scattering studies
Fried, J. ; Harder, J.A. ; Mahler, G.J. ; Makowiecki, D.S. ; Mead, J.A. ; Radeka, V. ; Schaknowski, N.A. ; Smith, G.C. ; Yu, B.
Pub. info.: Advances in neutron scattering instrumentation : 7-8 July, 2002, Seattle, Washington, USA.  pp.197-202,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4785
4.

Technical Paper
Technical Paper
4. Heat Transfer Computations for High Pressure Turbines.
Smith, G.C. ; Hiditch, M.A. ; Wood, N.B.
Pub. info.: A.S.M.E. paper.  2001.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2001
5.

Conference Proceedings
Conference Proceedings
5. Location of interconnect defects using focused ion beam (FIB) induced voltage contrast and subsequent auger electron analysis of in-situ FIB cross sections in the physical electronics 200/300-mm SMART-tool
Gondran, C.F.H. ; Paul, D.F. ; Childs, K.D. ; Dennig, L.G. ; Smith, G.C.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.142-148,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041