Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA. pp.140-148, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tairi, H. ; Sliwa, T. ; Voisin, Y. ; Diou, A. ; Radouane, L.
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Sixth International Conference on Quality Control by Artificial Vision. pp.314-322, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mathematics of Data/Image Coding, Compression, and Encryption VI, with Applications. pp.107-116, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering