1.

Conference Proceedings

Conference Proceedings
Schultz, A.B. ; Lyon, R.G. ; Kochte, M. ; Fraquelli, D.A. ; Bruhweiler, F. ; Jordan, I.J.E. ; Carpenter, K.G. ; DiSanti, M.A. ; Miskey, C. ; Rodrigue, M. ; Fadali, M.S. ; Skelton, D. ; Hart, H.M. ; Cheng, K.-P.
Pub. info.: Techniques and instrumentation for detection of exoplanets : 5-7 August 2003, San Diego, California, USA.  pp.262-271,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5170
2.

Technical Paper

Technical Paper
Scala, S. ; Konrad, M. ; Mason, R. ; Semick, J. ; Skelton, D.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 40th
3.

Technical Paper

Technical Paper
Skelton, D. ; Xiong, S. ; Lumkes, J. ; Breidi, F.
Pub. info.: 2013 Commercial Vehicle Engineering Congress and Exhibition : SAE technical paper.  2013.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2013
4.

Technical Paper

Technical Paper
Scala, S.M. ; Konrad, M. ; Mason, R.B. ; Skelton, D.
Pub. info.: AIAA paper.  2003.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2003
5.

Conference Proceedings

Conference Proceedings
Mason, R. ; Gintert, L. ; Rippeh, M. ; Skelton, D. ; Zunino, J. ; utmanis, I.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110K-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111
6.

Conference Proceedings

Conference Proceedings
Zunino lll, J.L. ; Skelton, D. ; Army Research, U.S.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV.  pp.122-130,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5716