Schultz, A.B. ; Lyon, R.G. ; Kochte, M. ; Fraquelli, D.A. ; Bruhweiler, F. ; Jordan, I.J.E. ; Carpenter, K.G. ; DiSanti, M.A. ; Miskey, C. ; Rodrigue, M. ; Fadali, M.S. ; Skelton, D. ; Hart, H.M. ; Cheng, K.-P.
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Techniques and instrumentation for detection of exoplanets : 5-7 August 2003, San Diego, California, USA. pp.262-271, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mason, R. ; Gintert, L. ; Rippeh, M. ; Skelton, D. ; Zunino, J. ; utmanis, I.
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. pp.61110K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zunino lll, J.L. ; Skelton, D. ; Army Research, U.S.
Pub. info.:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. pp.122-130, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering