Singhal, A. ; Sparks, T. ; Strozewski, K. ; Huang, F. ; Parihar, S. ; Schmidt, J. ; Boeck, B. ; Fretwell, J. ; Veap, G. ; Sheth, V. ; Veeraghavan, S. ; Melnick, B.
Pub. info.:
ULSI Process Integration : proceedings of the International Symposium. pp.217-222, 2003. Pennington, N.J.. Electrochemical Society
Singhal, A. ; Skandan, G. ; Amatucci, G. ; Pereira, N.
Pub. info.:
Interfaces, phenomena, and nanostructures in lithium batteries : proceedings of the International Workshop on Electrochemical Systems. pp.244-251, 2000. Pennington, N.J.. Electrochemical Society
Singhal, A. ; Paranthaman, M. ; Specht, E. D. ; Hunt, R. D. ; Beach, D. B. ; Martin, P. M. ; Lee, D. F.
Pub. info.:
Chemical aspects of electronic ceramics processing : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.. pp.203-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Mardyani, S. ; Singhal, A. ; Jiang, W. ; Chan, W.C.W.
Pub. info.:
Nanobiophotonics and biomedical applications II : 24-27 January 2005, San Jose, California, USA. pp.217-224, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA. pp.196-202, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jain, M. ; Skandan, G. ; Singhal, A. ; Agrawal, D. ; Feng, Y. ; La Monica, J. ; Kirsch, J.
Pub. info.:
Window and dome technologies and materials IX : 28-29 March 2005, Orlando, Florida, USA. pp.217-226, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jain, M. ; Skandan, G. ; Singhal, A. ; Agrawal, D. ; Feng, Y. ; Olson, K.R.
Pub. info.:
Window and come technologies VIII : 22-23 April 2003, Orlando, Florida, USA. pp.189-198, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In situ electron and tunneling microscopy of dynamic processes : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.155-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Yang, J. C. ; Singhal, A. ; Bradley, S. ; Gibson, J. M.
Pub. info.:
Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.. pp.227-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society