1.

Conference Proceedings
Conference Proceedings
1. Defect Physics Investigations Using Positron and Ion Beams
Simpson, P.J. ; Szpala, S. ; Knights, A.P.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.56-60,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
2.

Conference Proceedings
Conference Proceedings
2. DEFECTS IN MBE-GROWN SILICON EPILAYERS STUDIED WITH VARIABLE-ENERGY POSITRONS
Simpson, P.J. ; Schultz, P.J. ; Mitchel, I.V. ; Jackman, T.E. ; Aers, G.C.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.931-936,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
3.

Conference Proceedings
Conference Proceedings
3. Isotope effects in low-energy ion-induced splitting Invited
Terreault, B. ; Chicoine, M. ; Desrosiers, N. ; Giguere, A. ; Hobler, G. ; Moutanabbir, O. ; Ross, G.G. ; Schiettekatte, F. ; Simpson, P.J. ; Zahel, T.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.155-166,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
4.

Conference Proceedings
Conference Proceedings
4. Properties of Gate-Quality Silicon Nitride and Oxynitride Dielectrics Deposited Using an Electron Cyclotron-Resonance Plasma Source
Landheer, D. ; Hulse, J.E. ; Quance, T. ; Aers, G.C. ; Sproule, G.I. ; Lennard, W.N. ; Simpson, P.J. ; Nlassoumi, G.R.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium.  pp.75-89,  1999.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-6
5.

Conference Proceedings
Conference Proceedings
5. The Role of Impurities in the Formation of Voids in Silicon
Simpson, P.J. ; Knights, A.P.
Pub. info.: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.180-182,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 445-446