1.

Conference Proceedings
Conference Proceedings
1. Layout-based manufacturability assessment and yield prediction methodology
Simon,P. ; Veelenturf,K. ; Adrichem,P.van ; Jong,J.de ; Sprij,S. ; Maly,W.P.
Pub. info.: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland.  pp.282-288,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3743
2.

Conference Proceedings
Conference Proceedings
2. Ablation of solid targets with UV femtosecond pulses
Simon,P. ; Ihlemann,J. ; Klein-Wiele,J.-H. ; Bekesi,J. ; Marowsky,G.
Pub. info.: Computer-controlled microshaping : 16-18 June 1999, Munich, Germany.  pp.118-124,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3822
3.

Conference Proceedings
Conference Proceedings
3. The Use of Additional Redox Couples in the Investigation of the Electronic Conductivity of Passive Layers
Mattesco,P. ; Bui,N. ; Simon,P.
Pub. info.: Electrochemical methods in corrosion research VI : proceedings of the 6th International Symposium on Electrochemical Methods in Corrosion Research (EMCR VI), Trento, Italy, August 25-29, 1997.  Part2  pp.1073-1082,  1998.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 289-292
4.

Conference Proceedings
Conference Proceedings
4. Femtosecond UV-Laser Ablation of Solid Targets
Simon,P.
Pub. info.: OPTIKA '98, 14-17 September 1998, Budapest, Hungary.  pp.112-115,  1998.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3573