1.

Conference Proceedings
Conference Proceedings
1. Continuity of gamut mapping algorithms
Zolliker, P. ; Datwyler, M. ; Simon, K.
Pub. info.: Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA.  pp.220-233,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5667
2.

Conference Proceedings
Conference Proceedings
2. Toward image-dependent gamut mapping: fast and accurate gamut boundary determination
Giesen, J. ; Schuberth, E. ; Simon, K. ; Zolliker, P.
Pub. info.: Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA.  pp.201-210,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5667
3.

Conference Proceedings
Conference Proceedings
3. Waferstepper Alignment For MEMS Applications Using Diffraction Gratings
Zeijl, H.W. van ; Simon, K. ; Slabbekoorn, J. ; Buel, W.v. ; Gui, C.Q.
Pub. info.: BioMEMS and bionanotechnology : symposium held April 1-3, 2002, San Francisco, California, U.S.A..  pp.235-480,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 729
4.

Conference Proceedings
Conference Proceedings
4. Collinearity and stitching performance on an ASML stepper
van de Moosdijk, M. ; van den Brink, E. ; Simon, K. ; Friz, A. ; Phillipps, G.N. ; Travers, R.J. ; Raaymakers, E.
Pub. info.: Emerging Lithographic Technologies VI.  Part Two  pp.858-866,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4688