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Conference Proceedings

1. Introducing Advanced ULK Dielectric Mateials in Interconnects: Performance and Integration Challenges

Fusalba, F. ; Cornec, C.Le ; Maury, P. ; Remiat, B. ; Jousseaume, V. ; Haxaire, K. ; Mourier, T. ; Haumesser, P.H ; Maitrejean, S. ; Simon, J. ; Chabli, A. ; Passemard, G. ; Fusalba, F. ; Cornec, C.Le ; Maury, P. ; Remiat, B. ; Jousseaume, V.

Pub. info.:	Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.186-205, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-13

Conference Proceedings

2. Resist development status for immersion lithography

Jouve, A. ; Simon, J. ; Foucher, J. ; David, T. ; Tortai, J.-H. ; Solak, H.

Pub. info.:	Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.102-108, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5753(1)

Conference Proceedings

3. Interactions of Hydrophobically Modified Poly(N-Isopropylacrylamides) with Liposomes: Fluorescence Studies

Ringsdorf, H. ; Simon, J. ; Winnik, F. M.

Pub. info.:	Colloid-polymer interactions : particulate, amphiphilic, and biological surfaces : developed from a symposium. pp.216-, 1993. Washington, DC. American Chemical Society
Title of ser.:	ACS symposium series
Ser. no.:	532

Conference Proceedings

4. Strong Piezoelectric Effects in Unstrained GaN Quantum Wells

Langer, R. ; Simon, J. ; Konovalov, O. ; Pelekanos, N. T. ; Andre, R. ; Barski, A. ; Godlewski, M.

Pub. info.:	GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.. pp.G3.19.1-, 1999. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	537

Conference Proceedings

5. Piezoelectric Properties of GaN Self-Organized Quantum Dots

Daudin, B. ; Widmann, F. ; Simon, J. ; Feuillet, G. ; Rouviere, J. L. ; Pelekanos, N. T. ; Fishman, G.

Pub. info.:	GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.. pp.G9.2.1-, 1999. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	537

Conference Proceedings

6. World Volume Realization Of Automorphisms

Simon, J.

Pub. info.:	Noncommutative structures in mathematics and physics. pp.259-270, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	22

Technical Paper

7. On the Use of the Fast Multipole Method for Accurate Automotive Body Panel Acoustic Load Predictions.

Chaigne, S. ; Sylvand, G. ; Duceau, E. ; Simon, J.

Pub. info.:	2007 SAE Noise and Vibration Conference and Exhibition : technical paper. 2007. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2007

Technical Paper

8. Finite Element Hierarchic SINE Series Shape Functions

Locke, J. ; Simon, J.

Pub. info.:	A collection of technical papers : 43rd AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference : 10th AIAA/ASME/AHS Adaptive Structures Forum : 4th AIAA Non-Deterministic Approaches Forum : 3rd AIAA Gossamer Spacecraft Forum, Denver, Colorado, 22-25 April 2002. v. 1 pp.100-105, 2002. Reston, VA. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:	2002

Conference Proceedings

9. Overcoming pattern collapse on e-beam and EUV lithography [6153-155]

Jouve, A. ; Simon, J. ; Pikon, A. ; Solak, H. ; Vannuffel, C. ; Tortai, J.-H

Pub. info.:	Advances in Resist Technology and Processing XXIII. pp.61531C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6153

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Conference Proceedings

10. Monitoring of photo-resist poisoning

Simon, J. ; Weisbuch, F. ; Quere, Y. ; Louveau, O. ; Bourlot, C.

Pub. info.:	Advances in Resist Technology and Processing XX. 1 pp.303-309, 2003. Bellingham, CA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5039

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Author: Simon, J.