1.

Conference Proceedings

Conference Proceedings
Poyai,A. ; Simoen,E. ; Claeys,C. ; Rooyackers,R. ; Badenes,G. ; Gaubas,E.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  4218  pp.403-413,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings

Conference Proceedings
Kudou,T. ; Ohyama,H. ; Vanhellemont,J. ; Simoen,E. ; Claeys,C. ; Takami,Y. ; Fujii,A. ; Sunaga,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1217-1222,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Ohyama,H. ; Vanhellemont,J. ; Simoen,E. ; Claeys,C. ; Takami,Y. ; Hayama,K. ; Sunaga,H. ; Poortmans,J. ; Caymax,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.121-126,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Claeys,C. ; Simoen,E.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.324-341,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
5.

Conference Proceedings

Conference Proceedings
Simoen,E. ; Claeys,C. ; Neimash,V.B. ; Kraitchinskii,A. ; Kras'ko,M. ; Puzenko,O. ; Blondeel,A. ; Clauws,P.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  4218  pp.223-235,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218