1.

Conference Proceedings
Conference Proceedings
1. Transient Charging Effects and Its Implications to The Reliablility of High-k Dielectrics
Lee, B. H ; Choi, R ; Harris, R ; Krishan, S. A ; Young, C. D ; Sim, J. ; Bersuker, G
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.161-175,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Implementation of nationwide image sharing system
Choi, S.W. ; Sim, J. ; Ko, W. ; Park, C.H. ; Lee, J. ; Lim, D.H. ; Lee, J. ; Han, J. ; Lee, J. ; Hong, H.P. ; Choi, B.
Pub. info.: Medical Imaging 2003: PACS and Integrated Medical Information Systems: Design and Evaluation.  pp.30-35,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5033