Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.175-179, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.163-174, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland. pp.118-120, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization: measurement, analysis, and remote sensing II : 19-21 July 1999, Denver, Colorado. pp.144-149, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic and hybrid optical/digital systems for image and signal processing : 21-24 Septermber 1999, Lviv, Ukraine. pp.55-61, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Current Ukrainian research in optics and photonics : optoelectronic and hybrid optical/digital systems for image processing. pp.162-166, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.305-310, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Polarization Analysis and Applications to Device Technology. pp.316-319, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VIII. pp.81-91, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering