Shimomura, K. ; Okuda, Y. ; Okazaki, H. ; Kinoshita, Y. ; Pawlowski, G.
Pub. info.:
Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.380-387, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Maegawa, S. ; Ipposhi, T. ; Yamaguchi, Y. ; Iwamatsu, T. ; Maeda, S. ; Oashi, T. ; Ueda, K. ; Shimomura, K. ; Nishimura, T.
Pub. info.:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.352-358, 1997. Pennington, NJ. Electrochemical Society
Endo, Y. ; Nitta, Y. ; Kubo, H. ; Murao, T. ; Shimomura, K. ; Kimura, M. ; Watanabe, K. ; Yamamoto, S. ; Komori, S.
Pub. info.:
Sensors and camera systems for scientific, industrial, and digital photography applications IV : 21-23 January, 2003, Santa Clara, California, USA. pp.196-204, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chaneliere, C. ; Autran, J. L. ; Raynard, J. P. ; Michailos, M. ; Barla, K. ; Ushikawa, H. ; Hiroe, A. ; Shimomura, K. ; Kakimoto, A.
Pub. info.:
Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.75-, 2000. Warrendale, PA. MRS-Materials Research Society
Kawakita, Y. ; Kihara, T. ; Miki, K. ; Shimomura, K.
Pub. info.:
Integrated Optics: Devices, Materials, and Technologies VI. pp.289-297, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering