Tamai, Y. ; Oka, M.M. ; Nakada, A. ; Shibata, T. ; Ohmi, T.
Pub. info.:
ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology. pp.643-654, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger. pp.366-375, 1998. Pennington, New Jersey. Electrochemical Society
Shibata, T. ; Takahashi, T. ; Miyazaki, D. ; Sato, Y. ; Ikeuchi, K.
Pub. info.:
Polarization science and remote sensing II : 2-4 August 2005, San Diego, California, USA. pp.588804-588804, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Passivity and localized corrosion : an international symposium in honor of professor Norio Sato. pp.353-359, 1999. Pennington, NJ. Electrochemical Society
Fujimoto, S. ; Chihara, O. ; Somiya, K. ; Shibata, T.
Pub. info.:
Passivity and localized corrosion : an international symposium in honor of professor Norio Sato. pp.360-366, 1999. Pennington, NJ. Electrochemical Society
Hiramatsu, K. ; Matsushima, H. ; Shibata, T. ; Sawaki, N. ; Tadatomo, K. ; Okagawa, H. ; Ohuchi, Y. ; Honda, Y. ; Matsue, T.
Pub. info.:
Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.257-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Sakurai, H. ; Shibata, T. ; Itoh, M. ; Ooishi, K. ; Funakoshi, H. ; Okamoto, Y. ; Oono, S. ; Kaneda, M. ; Kamei, S. ; Hayashi, N.
Pub. info.:
EMLC 2005 : 21st European Mask and Lithography Conference : 31 January-3 February, 2005, Dresden, Germany. pp.29-36, 2005. Bellingham, Wash.,. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tomita, K. ; Migita, T. ; Shimonishi, S. ; Shibata, T. ; Ohmi, T. ; Nitta, T.
Pub. info.:
Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects. pp.286-297, 1994. Pennington, NJ. Electrochemical Society
Onuma, T. ; Chichibu, S.F. ; Sota, T. ; Asai, K. ; Sumiya, S. ; Shibata, T. ; Tanaka, M.
Pub. info.:
GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.. pp.515-520, 2002. Warrendale, Pa.. Materials Research Society