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17 results

Conference Proceedings

1. Mechanical Hole Burning Spectroscopy: A Nonlinear Viscoelastic Analysis (1083)

Shi,X. ; McKenna,G.B.

Pub. info.:	ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002. 1 pp.992-996, 2002. Brookfield, Conn.. Society of Plastic Engineers.
Title of ser.:	Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.:	60

Conference Proceedings

2. Feature-point-based multiscale shape coding

Shi,X. ; Zhang,Z.

Pub. info.:	Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.171-176, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4551

Conference Proceedings

3. Shape control using sidewall imaging

Su,B. ; Oshana,R. ; Menaker,M. ; Barak,Y. ; Shi,X.

Pub. info.:	Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.232-238, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3998

Conference Proceedings

4. Deposition of potassium lithium niobate films by sol-gel method

Zhang,H.X. ; Zhou,Y. ; Kam,C.H. ; Han,X.Q. ; Cheng,S.D. ; Ooi,B.S. ; Lam,Y.L. ; Chan,Y.C. ; Sun,Z. ; Yu,M.B. ; Shi,X. ; Yoon,S.F.

Pub. info.:	Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.425-432, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3896

Conference Proceedings

5. Structural,electrical,and optical properties of sol-gel-processed thin films of BaTi03 on ITO glass

Kam,C.H. ; Cheng,S.D. ; Zhou,Y. ; Pita,K. ; Han,X.Q. ; Que,W. ; Zhang,H.X. ; Lam,Y.L. ; Chan,Y.C. ; Can,W.S. ; Sun,Z. ; Shi,X.

Pub. info.:	Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.466-471, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3896

Conference Proceedings

6. Dual damascene photo process using negative-tone resist

Shi,X. ; Fung,A.C. ; Hsu,S. ; Li,Z. ; Nguyen,T. ; Socha,R.J. ; Conley,W.E. ; Dusa,M.V.

Pub. info.:	Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA. Part2 pp.835-842, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3999

Conference Proceedings

7. Design of 200-nm,170-nm,and 140-nm DUV contact sweeper high-transmission attenuating phase-shift mask:?.Experimental results

Socha,R.J. ; Shi,X. ; Holman,K.C. ; Dusa,M.V. ; Conley,W. ; Petersen,J.S. ; Chen,J.F. ; Laidig,T.L. ; Wampler,K.E. ; Caldwell,R.F. ; Chu,M.C. ; Su,C. ; Huang,K. ; Chen,C. ; Le,C. ; Pierrat,C. ; Su,B.

Pub. info.:	Optical microlithography XII : 17-19 March 1999, Santa Clara, California. Part1 pp.38-54, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3679

Conference Proceedings

8. Understanding the impact of full-field mask error factor

Conley,W.E. ; Shi,X. ; Hankinson,M. ; Dusa,M.V. ; Socha,R.J. ; Garza,C.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.580-587, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

9. Nano-aperture with 1000×power throughput enhancement for very small aperture laser system (VSAL)

Shi,X. ; Thornton,R.L. ; Hesselink,L.

Pub. info.:	Optical data storage 2001 : 22-25 April 2001 Santa Fe, USA. pp.320-327, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4342

10.

Conference Proceedings

10. Ultrafast and nonlinear optical characterization of optical limiting processes in fullerenes

Kohlman,R.S. ; Klimov,V. ; Grigorova,M. ; Shi,X. ; Mattes,B.R. ; McBranch,D.W. ; Wang,H. ; Wudl,F. ; Nogues,J.-L.R. ; Moreshead,W.V.

Pub. info.:	Fullerenes and photonics IV : 28-29 July, 1997, San Diego, California. pp.72-82, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3142

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