MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.60440V-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Precision Mechanical Measurements. pp.62802A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Precision Mechanical Measurements. pp.628027-628027, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo Y. ; Zhu L. ; Shi Z. ; Lv N. ; Dong M. ; Chen Q.
Pub. info.:
Third International Symposium on Precision Mechanical Measurements. pp.628029-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering