1.

Conference Proceedings
Conference Proceedings
1. Thin Film Measurements by Spectroscopic Ellipsometry Over an Extended Range
Cox, J.N. ; Hutchinson, J.M. ; Lee, K.K.D. ; Sheridan, B. ; Wong, R. ; Yang, I.-C.J.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.636-643,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
2.

Conference Proceedings
Conference Proceedings
2. Chemical Analysis of Particles and Semiconductor Microstructures by Synchrotron Radiation Soft X-ray Photoemission Spectromicroscopy
Gozzo, F. ; Triplett, B. ; Fujimoto, H. ; Ynzunza, R. ; Coon, P. ; Ayre, C. ; Kinney, P. D. ; Uritsky, Y. S. ; Ackermann, G. ; Johnson, A. ; Padmore, H. ; Renner, T. ; Sheridan, B. ; Steele, W. ; Hussain, Z.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.227-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524