1.

Conference Proceedings
Conference Proceedings
1. Punch-Through Behaviour of Wide Bandgap Materials(with Example in 6H-SiC)and its Benefit to JFETs
Kaminski,N. ; Sheppard,S.T. ; Niemann,E.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1073-1076,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
2.

Conference Proceedings
Conference Proceedings
2. High Temperature Performance of Implanted-Gate n-Channel JFETs in 6H-SiC
Sheppard,S.T. ; Lauer,V. ; Wondrak,W. ; Niemann,E.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1077-1080,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Nitride-Based Emitters on SiC Substrates
Edmond,J. ; Bulman,G. ; Kong,H.S. ; Leonard,M. ; Doverspike,K. ; Weeks,W. ; Niccum,J. ; Sheppard,S.T. ; Negley,G. ; Slater,D. ; Brown,J.D. ; Swindell,J.T. ; Overocker,T. ; Schetzina,J.F. ; Kuball,M. ; Nurmikko,A.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1421-1424,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. InGaN/GaN lasers grown on SiC (Invited Paper)
Doverspike,K. ; Bulman,G.E. ; Sheppard,S.T. ; Kong,H.S. ; Leonard,M.T. ; Dieringer,H. ; Edmond,J.A. ; More,K.L. ; Song,Y.-K. ; Kuball,M. ; Nurmikko,A.V.
Pub. info.: In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II.  pp.82-93,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3284