Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

19 results

Conference Proceedings

1. Wigner function and ambiguity function fot nonparaxial wavefields

Sheppard,C.J.R. ; Larkin,K.G.

Pub. info.:	Optical processing and computing : a tribute to Adolf Lohmann : 17-18 April 2001, Orlando, USA. pp.99-103, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4392

Conference Proceedings

2. Geometric phase low-coherence interference microscopy at high numerical apertures

Roy,M. ; Svahn,P. ; Sheppard,C.J.R.

Pub. info.:	Photonics 2000 : International Conference on Fiber Optics and Photonics : 18-20 December 2000, Calcutta, India : proceedings. pp.529-532, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4417

Conference Proceedings

3. Limitations of the confocal imaging algorithm in surface profiling

Aguilar,J.F. ; Sheppard,C.J.R.

Pub. info.:	18th Congress of the International Commission for Optics : Optics for the next millennium : 2-6 August, 1999, San Francisco, California. pp.490-491, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3749

Conference Proceedings

4. Novel method for beam collimation using multiple-beam shearing interferometry

Matsuda,K. ; Roy,M. ; Fekete,P.W. ; Eiju,T. ; Sheppard,C.J.R. ; O'Byrne,J.W.

Pub. info.:	Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.2-8, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3275

Conference Proceedings

5. High-aperture Gaussian beams

Sheppard,C.J.R. ; Saghafi,S.

Pub. info.:	Third Iberoamerican Meeting on Optics and sixth Latin American Meeting on Optics, Lasers, and Their Applications : 28 September-2 October 1998, Cartagena de Indias, Colombia. pp.57-61, 1999. Bellingham, WA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3572

Conference Proceedings

6. Effects of Fresnel number in focusing and imaging

Sheppard,C.J.R. ; Torok,P.

Pub. info.:	Selected papers from International Conference on Optics and Optoelectronics '98 : Silber Jubilee Symposium of the Optical Society of India : 9-12 December 1998, Dehradun, India. pp.458-472, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3729

Conference Proceedings

7. Reconstruction of surface profiles from scattering data

Sheppard,C.J.R. ; Quartel,J.C.

Pub. info.:	Second Iberoamerican Meeting on Optics : 18-22 September 1995, Guanajuato, México. pp.290-293, 1996. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2730

Conference Proceedings

8. Simultaneous multichannel nonlinear imaging:combined two-photon excited fluorescence and second-harmonic generation microscopy

Gauderon,R. ; Lukins,P.B. ; Sheppard,C.J.R.

Pub. info.:	Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.115-118, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4082

Conference Proceedings

9. Low-coherence interference microscopy at high numerical apertures

Sheppard,C.J.R. ; Roy,M. ; Svahn,P.

Pub. info.:	Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.57-60, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4082

10.

Conference Proceedings

10. Interferometric measurement of refractive index profiles for thin film characterization

Sheppard,C.J.R.

Pub. info.:	Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.442-449, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3098

19 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by: