1.

Conference Proceedings

Conference Proceedings
Lavigne,J.J. ; Metzger,A. ; Niikura,K. ; Cabell,L.A. ; Savoy,S.M. ; Yoo,J.S.-J. ; McDevltt,J.T. ; Neikirk,D.P. ; Shear,J.B. ; Anslyn,E.V.
Pub. info.: Proceedings of advances in fluorescence sensing technology IV : 24-27 January 1999, San Jose, California.  pp.220-231,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3602
2.

Conference Proceedings

Conference Proceedings
Savoy,S.M. ; Lavigne,J.J. ; Yoo,J.S.-J. ; Wright,J. ; Rodriguez,M. ; Goodey,A. ; McDoniel,B. ; McDevitt,J.T. ; Anslyn,E.V. ; Shear,J.B. ; Ellington,A. ; Neikirk,D.P.
Pub. info.: Chemical microsensors and applications : 4-5 November 1998, Boston, Massachusetts.  pp.17-26,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3539
3.

Conference Proceedings

Conference Proceedings
Shear,J.B. ; Gostkowski,M.L. ; Gordon,M.J. ; Okerberg,E. ; Curey,T.E. ; McDoniel,J.B. ; Kang,T.J. ; Bout,D.A.Vanden
Pub. info.: Multiphoton microscopy in the biomedical sciences, 21-23 January, 2001, San Jose, USA.  pp.210-216,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4262
4.

Conference Proceedings

Conference Proceedings
Xu,C. ; Mertz,J. ; Shear,J.B. ; Webb,W.W.
Pub. info.: Imaging spectrometry II : 7-8 August 1996, Denver, Colorado.  pp.274-276,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2819
5.

Conference Proceedings

Conference Proceedings
Sohn,Y.-S. ; Tsao,A. ; Anslyn,E.V. ; McDevitt,J.T. ; Shear,J.B. ; Neikirk,D.P.
Pub. info.: Microfluidic Devices and Systems III.  pp.212-219,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4177