Signal and data processing of small targets 1998 : 14-16 April 1998, Orlando, Florida. pp.428-439, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.74-83, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition VIII : 5-7 April 1999, Orlando, Florida. pp.239-248, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal and data processing of small targets 2000 : 24-27 April 2000, Orlando, USA. pp.321-332, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering