Rapid thermal and other short-time processing technologies : proceedings of the international symposium. pp.329-336, 2000. Pennington, NJ. Electrochemical Society
The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000. pp.131-144, 2000. Pennington, N.J.. Electrochemical Society
Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11. pp.187-193, 1997. Pennington, NJ. Electrochemical Society
Rapid thermal and other short-time processing technologies II : proceedings of the international symposium. pp.157-162, 2001. Pennington, NJ. Electrochemical Society
Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium. pp.109-126, 2001. Pennington, N.J.. Electrochemical Society
Sharangpani, R. ; Singh, R. ; Parihar, V. ; Thakur, R.P.S.
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Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues. pp.15-19, 1997. Pennington, NJ. Electrochemical Society
Sharangpani, R. ; Muthukrishnan, S. ; Kher, S. ; Narwankar, P. ; Goyani, T. ; Ma, Y. ; Ahmed, K. ; Conti, G.
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Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.146-150, 2005. Pennington, NJ. Electrochemical Society
Rapid thermal and other short-time processing technologies : proceedings of the international symposium. pp.203-214, 2000. Pennington, NJ. Electrochemical Society
Sharangpani, R. ; Das, J. ; Tay, S. P. ; Thakur, R. P. S. ; Yang, T. C. ; Saraswat, K. C.
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Rapid thermal and integrated processing VII : symposium held April 13-15, 1998, San Francisco, California, U.S.A.. pp.143-, 1998. Pittsburgh, PA. MRS - Materials Research Society