Shah, M. ; Ohmer, M. C. ; Fischer, D. W. ; Fernelius, N. C. ; Manasreh, M. O. ; Schunemann, P. G. ; Pollak, T. M.
Pub. info.:
Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.. pp.463-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Bitko, G. ; Harries, R. ; Matkin, J. ; McNeil, A. C. ; Monk, D. J. ; Shah, M. ; Wertz, J.
Pub. info.:
Thin films, stresses and mechanical properties VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.365-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Sheikh, Y. ; Gritai, A. ; Junejo, I. ; Muise, R. ; Mahalanobis, A. ; Shah, M.
Pub. info.:
Airborne intelligence, surveillance, reconnaissance (ISR) systems and applications II : 29-30 March 2005, Orlando, Florida, USA. pp.114-121, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Shah, M. ; Manasreh, M. O. ; Kaspi, R. ; Yen, M. Y. ; Philips, B. A. ; Skowronski, M. ; Shinar, J.
Pub. info.:
Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.. pp.449-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Katz, A. ; Alimova, A. ; Siddique, M. ; Savage, H.E. ; Shah, M. ; Rosen, R. ; Alfano, R.
Pub. info.:
Chemical and biological point sensors for homeland defense : 29-30 October 2003, Providence, Rhode Island, USA. pp.217-220, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering