1.

Conference Proceedings
Conference Proceedings
1. Low-cost system for ancient stamps range image acquisition
Thomas, E. ; Fofi, D. ; Nicolier, F. ; Millon, G. ; Seulin, R.
Pub. info.: Machine Vision Applications in Industrial Inspection XIII.  pp.288-301,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5679
2.

Conference Proceedings
Conference Proceedings
2. Range image binarization: applications to wooden stamp analysis
Seulin, R. ; Morel, O. ; Millon, G. ; Nicolier, F.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.252-258,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
3.

Conference Proceedings
Conference Proceedings
3. Complete machine vision solution for tube inspection in nuclear industry
Seulin, R. ; Voisin, Y. ; Fofi, D. ; Meriaudeau, F.
Pub. info.: Machine Vision Applications in Industrial Inspection XII.  pp.128-136,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5303
4.

Conference Proceedings
Conference Proceedings
4. Machine vision system for surface inspection on brushed industrial parts
Bonnot, N. ; Seulin, R. ; Merienne, F.
Pub. info.: Machine Vision Applications in Industrial Inspection XII.  pp.64-72,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5303
5.

Conference Proceedings
Conference Proceedings
5. Simulation process for the design and optimization of a machine vision system for specular surface inspection
Seulin, R. ; Bonnot, N. ; Merienne, F. ; Gorria, P.
Pub. info.: Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II.  pp.129-140,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4567