1.

Conference Proceedings
Conference Proceedings
1. Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
Pantelic, N. ; Piruska, A. ; Seliskar, C.J.
Pub. info.: Recent developments in advanced materials and processes : selected papers presented at the 7th Conference of the Yugoslav Materials Research Society, held in Herceg Novi, Serbia and Montenegro, September 12-16, 2005.  pp.431-438,  2006.  Uetikon-Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 518
2.

Conference Proceedings
Conference Proceedings
2. Spectroelectrochemical Sensing Based on Multimode Selectivity Simultaneously Achievable in a Single Device
Slaterbeck, A.F. ; Shi, Y. ; Seliskar, C.J. ; Ridgway, T.H. ; Heineman, W.R.
Pub. info.: Proceedings of the Symposium on Chemical and Biological Sensors and Analytical Electrochemical Methods.  pp.50-60,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-19
3.

Conference Proceedings
Conference Proceedings
3. Adsorption of fluorescently labeled microbeads on PDMS surfaces
Nikcevic, I. ; Bange, A. ; Peterson, E.T.K. ; Papautsky, I. ; Heineman, W.R. ; Halsall, H.B. ; Seliskar, C.J.
Pub. info.: Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA.  pp.159-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5718
4.

Conference Proceedings
Conference Proceedings
4. Microscale immunosensors for biological agents (Invited Paper)
Bange, A. ; Wong, D.K.Y. ; Seliskar, C.J. ; Halsall, H.B. ; Heineman, W.R.
Pub. info.: Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA.  pp.142-150,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5718